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While the existence of a non-integer train station platform in the Harry Potter series is a source of delightful whimsy, the reality of electron detectors registering non-integer electrons can be a headache for electron microscopists worried about non-Poisson noise. Although there is no such thing as ¾ of an electron, when an electron enters a pixel in a direct electron detector, the signal energy can spread into neighboring pixels [1], giving a fractional signal. This seemingly innocent effect is a serious problem for Fluctuation Electron Microscopy (FEM) when attempting to correct Poisson noise in low- uence experiments [2]. The Poisson distribution applies strictly to countable discrete events.more » « less
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Zjajo, A; Du, H; Dunin-Borkowski, R E; Rezikyan, A; Gibson, J M; Treacy, M_M J (, Microscopy and Microanalysis)Fluctuation Electron Microscopy (FEM) is a versatile technique for detecting subtle traces of ordering in amorphous and glassy materials [1–4]. However, quantitative results remained elusive, mainly because experimental variance data disagree with theory by several orders of magnitude. The reasons for this discrepancy are still a mystery. We present a preliminary report on what we know.more » « less
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